Authors
Citation
H. Woo, Bluetooth-IC testing meets chip design, EDN, 46(10), 2001, pp. 77-80
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
EDN
ISSN journal
00127515
→ ACNP
Volume
46
Issue
10
Year of publication
2001
Pages
77 - 80
Database
ISI
SICI code
0012-7515(20010503)46:10<77:BTMCD>2.0.ZU;2-W