Intrinsic Josephson junctions with single crystals or thin films of high-Tc
superconductor have been studied. For this purpose, BiSrCaCuO (2212) films
have been deposited on tilted strontium titanate substrates using a de spu
ttering system. Superconducting and structural properties of these films ha
ve already been reported in II]. In the present study, the surface morpholo
gy of films deposited on the tilted substrates is investigated by Atomic Fo
rce Microscopy, Many steps and terraces are seen in the film on the tilted
substrate. Furthermore, two more films, prepared on the tilted substrates s
imultaneously are subjected to resistivity measurements across and along th
e terraces, respectively. The anisotropy parameter gamma,((ratio of resisti
vity measured along the c-axis and the a-axis)<^>0.5), calculated from the
resistivity measurement is found to be of the order of 50 in the films. A s
emiconductor-like behavior has been observed above the critical temperature
in the temperature - resistivity characteristics, across the terraces.