Fabrication and measurement of intrinsic Josephson junctions in misalignedfilms of Tl2Ba2CaCu2O8

Instrinsic Josephson bridges have been patterned in films of Tl2Ba2CaCu2O8. Due to our device geometry we have used films that are misaligned at 20 de grees to the substrate surface. This misalignment has been confirmed using four-circle x-ray diffraction and cross-sectional transmission electron mic roscopy, Our films still retain a high critical temperature (108K) despite their misalignment, The resistive anisotropy of the film is comparable to s ingle crystal data. The product of the critical current and normal state re sistance is equal to 14mV at 4.2K and is independent of the critical curren t density, These two achievements are attributed to the lack of engineered interfaces in our intrinsic junctions. A run-to-run variation in the critic al current is explained by the presence of non-Josephson shunts in the junc tion, Junctions with fewer non-Josephson shunts show greater hysteresis.