Jh. Lim et al., Fabrication and characterization of micro-structural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape, IEEE APPL S, 11(1), 2001, pp. 2796-2799
We Fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and ev
aluated the effect of twisting on the microstructural evolution such as gra
in size, grain alignment, and interface morphology, and on the resulting cr
itical current. Twist pitches of the BSCCO tapes are in the range of 70 to
8 mm and uniformly deformed. It was observed that the grain size and the de
gree of texture decreased with decreasing pitch, probably due to the format
ion of the irregular interface between the Ag and the filaments. In additio
n, the critical current of the tapes decreased with decreasing pitch. For t
he tape having a twist pitch of 8 mm, approximately 50% of the critical cur
rent was maintained compared to that of the untwisted tape. The reduction o
f critical current may be related to the interface irregularity, smaller gr
ain size, poorer texture and presence of creeks due to the induced strain d
uring the twisting processing.