Critical persistent current for a loop formed by a Bi-2223Ag-sheathed superconducting tape

Authors
Citation
L. Horng et Ch. Tai, Critical persistent current for a loop formed by a Bi-2223Ag-sheathed superconducting tape, IEEE APPL S, 11(1), 2001, pp. 3006-3009
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3006 - 3009
Database
ISI
SICI code
1051-8223(200103)11:1<3006:CPCFAL>2.0.ZU;2-T
Abstract
A persistent current loop formed by a Bi-2223 Ag-sheathed superconducting t ape has been fabricated by tape joint technique. The current decay measurem ent was used to determine the persistent current of the loop at 77K. A de c urrent exceeding the critical current I-c of the loop defined by 1 muV/cm c riterion was transmitted into the loop. The persistent current is found to about 25% of its I-c value of the tape. Based on detailed measurements of t he voltage-current curves, the low level resistances down to very low volta ge (< 1 nanovolt) at the jointed and unjointed parts were tested, respectiv ely. The jointed section has a larger I-c value of 1 muV/cm criterion than the unjointed one. However, it is found that the persistent current of this test loop is limited by the jointed section, because the residual resistan ce of the jointed section is larger. These results illustrate that in the j ointed section the flux motion is more serious and the weaker grain boundar ies or jointing interfaces limits the persistent transport currents.