A microwave broadband technique to measure the complex resistivity of HTS thin films

Citation
N. Tosoratti et al., A microwave broadband technique to measure the complex resistivity of HTS thin films, IEEE APPL S, 11(1), 2001, pp. 3082-3085
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3082 - 3085
Database
ISI
SICI code
1051-8223(200103)11:1<3082:AMBTTM>2.0.ZU;2-V
Abstract
We propose a new broadband swept frequency technique to measure the complex resistivity of high T-c superconducting thin films in the microwave range (from a few GHz up to 50 GHz), A coaxial cable connects the sample to a vec tor network analyzer which performs reflection measurements; the film and t he coaxial end are separated by a short section of circular waveguide. The absence of direct electrical contact between the sample and the coaxial cor e simplifies realization and avoids contact instability with large temperat ure variations, We provide an electromagnetic analysis of the coaxial to cy lindrical transition (CCT) and find a closed form relation between the meas ured quantities and the film resistivity. Finally, we present some experime ntal results obtained for an YBa2Cu3O7-delta thin film using the described method.