Transmission electron microscopy investigation of texture development in magnesium oxide buffer layers

Biaxially textured magnesium oxide (MgO) buffer layers were grown by inclin ed substrate deposition and examined before YBa2Cu3O7-x deposition to optim ize their texture, Transmission electron microscopy of buffer layers in bot h cross-sectional and plan view was used to investigate film microstructure and texture development as a function of deposition thickness (0.05-3 mum) and substrate inclination angle (0-55 degrees from the substrate normal). It was determined that the combined effects of preferential growth of the { 200} equilibrium crystal habit of MgO and shadowing by columnar grains led to the development of off-axis (200) -textured films.