Dw. Ha et al., Influence of Ge addition on phase formation and electromagnetic propertiesin internal tin processed Nb3Sn wires, IEEE APPL S, 11(1), 2001, pp. 3565-3568
In order to investigate the effect of Ge addition to the Cu matrix on the m
icrostructure and the critical current density, four kinds of internal tin
processed Nb3Sn strands with pure Cu and Cu - 0.2, 0.4, 0.6 wt % Ge alloys
were drawn to 0.8 mm diameter. The microstructure and critical current of i
nternal tin processed Nb3Sn wires that were heat treated at temperatures ra
nging from 680 degreesC to 740 degreesC for 240 h were investigated. The Ge
addition to the matrix did not make workability worse, A Ge rich layer in
the Cu-Ge matrix suppressed the growth of the Nb3Sn layer and promoted grai
n coarsening. The greater the Ge content in the matrix, the lower the net J
(c) result after Nb3Sn reaction heat treatment. There was no significant va
riation in J(c) observed with heat treatment temperature ranging from 680 d
egreesC to 740 degreesC.