Influence of Ge addition on phase formation and electromagnetic propertiesin internal tin processed Nb3Sn wires

Citation
Dw. Ha et al., Influence of Ge addition on phase formation and electromagnetic propertiesin internal tin processed Nb3Sn wires, IEEE APPL S, 11(1), 2001, pp. 3565-3568
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3565 - 3568
Database
ISI
SICI code
1051-8223(200103)11:1<3565:IOGAOP>2.0.ZU;2-Q
Abstract
In order to investigate the effect of Ge addition to the Cu matrix on the m icrostructure and the critical current density, four kinds of internal tin processed Nb3Sn strands with pure Cu and Cu - 0.2, 0.4, 0.6 wt % Ge alloys were drawn to 0.8 mm diameter. The microstructure and critical current of i nternal tin processed Nb3Sn wires that were heat treated at temperatures ra nging from 680 degreesC to 740 degreesC for 240 h were investigated. The Ge addition to the matrix did not make workability worse, A Ge rich layer in the Cu-Ge matrix suppressed the growth of the Nb3Sn layer and promoted grai n coarsening. The greater the Ge content in the matrix, the lower the net J (c) result after Nb3Sn reaction heat treatment. There was no significant va riation in J(c) observed with heat treatment temperature ranging from 680 d egreesC to 740 degreesC.