Production of double-sided large-area high-T-c wafers by molecular beam epitaxy

Citation
M. Naito et al., Production of double-sided large-area high-T-c wafers by molecular beam epitaxy, IEEE APPL S, 11(1), 2001, pp. 3848-3851
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3848 - 3851
Database
ISI
SICI code
1051-8223(200103)11:1<3848:PODLHW>2.0.ZU;2-C
Abstract
We describe the growth and properties of high-T-c films by molecular beam e pitaxy (MBE). MBE growth of high-T-c films requires a reliable rate control for individual elements and a strong activated oxygen source. By satisfyin g these two requirements, we have succeeded in growing high-quality Dy-123 films. In addition, we have achieved doubleside deposition on large-area su bstrates (so far up to 35 mm square). Films on MgO substrates typically sho w T-c(end) > 90 K, rho (300 K) < 300 mu Omega cm, J(c) similar to 2-5 x 10( 6) A/cm(2) at 77K, R-s @ 22GHz similar to 2-4 m Omega at 77K, which are com parable to the best values for 123 films obtained at present by other growt h methods.