IF bandwidth and noise temperature measurements of NbNHEB mixers on MgO substrates

Citation
S. Miki et al., IF bandwidth and noise temperature measurements of NbNHEB mixers on MgO substrates, IEEE APPL S, 11(1), 2001, pp. 175-178
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
175 - 178
Database
ISI
SICI code
1051-8223(200103)11:1<175:IBANTM>2.0.ZU;2-9
Abstract
We report the fabrication and testing of hot electron bolometric mixers wit h an ultrathin NbN film as heterodyne receivers operating at the terahertz frequencies. We found that the qualities of NbN strip are usually degraded by the damages resulting from fabrication process, We have developed a fabr ication process for reducing the damages in NbN films. We also fabricated H EB mixers with a new structure In order to study the IF bandwidth determine d by the original qualities of NbN thin films, Investigations at 100 GHz re vealed that the widest IF bandwidth of 2.0 GHz was obtained by a mixer base d on 2.8 nm-thick NbN film An usual type of HEB mixer based on the 2.8 nm-t hick NbN film was also fabricated and evaluated. The receiver noise tempera ture at 900 GHz was 780 K, the absorbed LO power was about 400 nW, and the conversion gain was -13 db.