Noise and spatial resolution in SQUID microscopy

Citation
S. Chatraphorn et al., Noise and spatial resolution in SQUID microscopy, IEEE APPL S, 11(1), 2001, pp. 234-237
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
234 - 237
Database
ISI
SICI code
1051-8223(200103)11:1<234:NASRIS>2.0.ZU;2-J
Abstract
We have used a scanning SQUID microscope to image magnetic field generated by currents in integrated circuits. To obtain current paths in these circui ts, we apply a magnetic inversion technique to the magnetic field data. We find that the spatial resolution obtained from this technique is related to the signal-to-noise ratio, the SQUID-sample separation and the data sampli ng interval. We describe in detail a mathematical model of how these parame ters relate to the spatial resolution. Finally, we discuss the limitations of our apparatus, and how to achieve higher spatial resolution.