On-chip high-frequency diagnostic of RSFQ logic cells

Authors
Febvre, P Berthet, JC Ney, D Roussy, A Tao, JW Angenieux, G Hadacek, N Villegier, JC
Citation
P. Febvre et al., On-chip high-frequency diagnostic of RSFQ logic cells, IEEE APPL S, 11(1), 2001, pp. 284-287
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
284 - 287
Database
ISI
SICI code
1051-8223(200103)11:1<284:OHDORL>2.0.ZU;2-I
Abstract
Hilbert Transform spectroscopy is described as a method to analyze the spec trum of pulse trains generated by RSFQ circuits. Simulations are carried ou t using parameters appropriate for NbN Josephson junctions for both generat ion and detection of SFQ pulse trains. It is shown that the pulse shape alo ng with the pulse train repetition rate can be extracted through the use of a Josephson junction, used as a spectrometer, and located on-chip with the RSFQ circuit to test.