We have fabricated a contact with a small area on a YBa2Cu3O7-y (YBCO) grou
nd plane grown by Liquid Phase Epitaxy (LPE). The contact has a ramped edge
structure, which directly connects CuO2 planes between the ground plane an
d lines. After deposition of NdBa2Cu3O7-x (NBCO) films used for lines, no d
eterioration is observed in AFM image on the ramped edge in spite of its hi
gher deposition temperature than that of the YBCO thin film. This shows hig
h crystal quality of the YBCO film grown by LPE, Flux flow type current-vol
tage characteristics are observed with critical current density of 5x10(4)
A/cm(2) at 47 K. XRD shows strain caused by lattice mismatch along the boun
daries between NBCO and YBCO.