Fabrication and characterization of hot-electron bolometers for THz applications

Authors
Frommberger, M Sabon, P Schicke, M Mattiocco, F Schuster, KF
Citation
M. Frommberger et al., Fabrication and characterization of hot-electron bolometers for THz applications, IEEE APPL S, 11(1), 2001, pp. 566-569
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
566 - 569
Database
ISI
SICI code
1051-8223(200103)11:1<566:FACOHB>2.0.ZU;2-G
Abstract
Superconducting properties of Nh and NbN thin films for application in diff usion and phonon cooled Hot-Electron Bolometers have been systematically in vestigated. The materials were sputtered on fused quartz substrates in a wi de thickness range. DC-measurements of the Nh films allow us to predict the intermediate frequency bandwidth of a hot-electron bolometer mixer device for a given design. To improve the characteristics of the NbN thin films, w e used a 15 nm MgO seed layer.