Development of practical soft X-ray spectrometers.

Citation
G. Brammertz et al., Development of practical soft X-ray spectrometers., IEEE APPL S, 11(1), 2001, pp. 828-831
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
828 - 831
Database
ISI
SICI code
1051-8223(200103)11:1<828:DOPSXS>2.0.ZU;2-2
Abstract
Cryogenic soft X-ray imaging spectrometers are currently being developed fo r applications in the fields of astronomy and material sciences, In this pa per we present experiments on optimized single devices, which show measured energy resolutions of 4.6 eV, 8.1 eV and 20.5 eV at 525 eV, 1.5 keV and 6 keV respectively. These energy resolutions combined with a quantum efficien cy of more than 40 % in the energy range from 0.5 to 2 keV together with a count rate capability of 15 kHz demonstrate the overall good performance of single Superconducting Tunnel Junctions (STJs), Assembling these optimized single devices in a matrix read-out would provide the practical basis for a soft X-ray imaging spectrometer.