Can RSFQ logic circuits be scaled to deep submicron junctions?

Citation
Am. Kadin et al., Can RSFQ logic circuits be scaled to deep submicron junctions?, IEEE APPL S, 11(1), 2001, pp. 1050-1055
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
1050 - 1055
Database
ISI
SICI code
1051-8223(200103)11:1<1050:CRLCBS>2.0.ZU;2-Z
Abstract
Scaling of niobium RSFQ integrated circuit technology to deep submicron dim ensions (Linewidths of 300 nm or less) should permit increased clock rate ( up to 250 GHz) and increased areal density of Josephson junctions (up to 1 million junctions/cm(2)), without the need for external shunt resistors, It is shown how existing circuit layouts can be scaled down to these dimensio ns, while maintaining the precise timing essential for correct operation. A dditional issues related to the practical realization of such circuits are discussed, including effects of self-heating and models for the generation and propagation of sub-ps single-flux-quantum pulses.