Ferroelectric characterisation using Josephson junctions

Authors
McBrien, PF Booij, WE Burnell, G Kahlmann, F Blamire, MG Romans, EJ Pegrum, CM Tarte, EJ
Citation
Pf. Mcbrien et al., Ferroelectric characterisation using Josephson junctions, IEEE APPL S, 11(1), 2001, pp. 1158-1161
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
1158 - 1161
Database
ISI
SICI code
1051-8223(200103)11:1<1158:FCUJJ>2.0.ZU;2-3
Abstract
Measurements of the permittivity of a series of strontium titanate films of various thicknesses at frequencies from 100 to 900GHz are reported, The pe rmittivity was measured using Josephson junctions coupled to external reson ators. The permittivity was found to decrease with decreasing film thicknes s and was frequency independent. On application of a dielectric bias voltag e, the permittivity of a 200nm film was tunable between 245 and 112 at 30K.