We have developed a fabrication method using a focused ion beam microscope
that allows us to produce SNS junctions in which thermally energetic electr
ons can enter the N region. We report on SQUIDs made with this technique wh
ich we are developing as proof of concept devices and prototype high energy
resolution spectrometers. We discuss the various design parameters used fo
r our devices and present results from our prototype SQUIDs, We present res
ults for devices with a variety of N-electrode structures and discuss their
suitability for our application.