Non-destructive testing using a HTS SQUID

Authors
Nakane, H Kabasawa, R Adachi, H
Citation
H. Nakane et al., Non-destructive testing using a HTS SQUID, IEEE APPL S, 11(1), 2001, pp. 1291-1294
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
1291 - 1294
Database
ISI
SICI code
1051-8223(200103)11:1<1291:NTUAHS>2.0.ZU;2-V
Abstract
We have used a high temperature superconductor (HTS) SQUID in an unshielded environment to perform eddy current nondestructive testing measurement of a multi-layer aluminum structure. The sensor consists of an YBCO de superco nducting quantum interference device (SQUID), As a demonstration of the sys tem's capabilities, subsurface defects in a multi-layer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen.