Surface field dynamics in de film capacitors under an impulse voltage perturbation

Authors
Citation
Yp. Lee et Mg. Kong, Surface field dynamics in de film capacitors under an impulse voltage perturbation, IEEE DIELEC, 8(2), 2001, pp. 293-298
Citations number
19
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
ISSN journal
10709878 → ACNP
Volume
8
Issue
2
Year of publication
2001
Pages
293 - 298
Database
ISI
SICI code
1070-9878(200104)8:2<293:SFDIDF>2.0.ZU;2-O
Abstract
For metalized polymer film capacitors, the dynamics of electric field on th e electrode surface and its resulting energy dissipation influence the onse t and scale of breakdown discharges within the capacitor unit, which in tur n is indicative of the reliability and lifetime. To gain an understanding o f the dependence of surface electric field on key system parameters, an equ ivalent circuit model is developed to simulate the temporal evolution of th e electric field distribution within a dc film capacitor subjected to an ex ternal impulse electric stress. A mosaic pattern of electrode segmentation is taken into account by means of an effective surface resistance and its e ffects on surface electric field and energy dissipation are computed numeri cally. Also considered are the effects of the number of electrode segments across a given length. In addition, electric energy dissipation is calculat ed to assess the level of possible temperature rise within the capacitor. B y addressing these two issues, it is shown that the numerical code develope d and its underlying methodology can serve as a complimentary tool to the p resent practice of capacitor designs and performance assessment.