High precision comparison between SNS and SIS Josephson voltage standards

Authors
Jeanneret, B Rufenacht, A Burroughs, CJ
Citation
B. Jeanneret et al., High precision comparison between SNS and SIS Josephson voltage standards, IEEE INSTR, 50(2), 2001, pp. 188-191
Citations number
12
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
50
Issue
2
Year of publication
2001
Pages
188 - 191
Database
ISI
SICI code
0018-9456(200104)50:2<188:HPCBSA>2.0.ZU;2-M
Abstract
Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of (1.4 +/- 3.4) X 10(-10) at 1 V, This result demonstrates the new system is funct ioning properly and can be used in various types of measurements. In partic ular it will be one of the key components of the Watt balance experiment [1 ] that is presently under construction at OFMET.