Density comparison measurement of silicon by pressure of flotation method

Citation
A. Waseda et K. Fujii, Density comparison measurement of silicon by pressure of flotation method, IEEE INSTR, 50(2), 2001, pp. 604-607
Citations number
6
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
50
Issue
2
Year of publication
2001
Pages
604 - 607
Database
ISI
SICI code
0018-9456(200104)50:2<604:DCMOSB>2.0.ZU;2-#
Abstract
We have developed a new density comparison measurement system for silicon c rystals using the pressure of flotation method (PFM) to evaluate the consis tency in the absolute densities and to study defect and impurity effects on silicon single crystals. We have carried out density comparison measuremen ts for the density standard and Avogadro constant silicon spheres of the Na tional Research Laboratory of Metrology (NRLM), Ibaraki, Japan. We have cal culated the adjusted densities from our comparison and absolute measurement s based on a least-squares analysis using a matrix formulation.