Initialization parameters used in infrared optical thin film monitoring sys
tem, including input coatings, monitoring mode, monitoring wavelength, mate
rial coefficients, slice options,etc.,were listed in forms of dialog contro
l. When the user inputs these parameters, the application programme can aut
omatically check these parameters' validity to ensure that the contents the
user inputs are correct, thus, it supplies a kind of security mechanism fo
r subsequent automatic control of optical thin film process. The correspond
ing algorithm was also given in this paper.