Initialization parameter auto-check algorithm execution of infrared thin film monitoring system

Citation
Mf. Hu et al., Initialization parameter auto-check algorithm execution of infrared thin film monitoring system, J INF M W, 20(2), 2001, pp. 133-135
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN journal
10019014 → ACNP
Volume
20
Issue
2
Year of publication
2001
Pages
133 - 135
Database
ISI
SICI code
1001-9014(200104)20:2<133:IPAAEO>2.0.ZU;2-T
Abstract
Initialization parameters used in infrared optical thin film monitoring sys tem, including input coatings, monitoring mode, monitoring wavelength, mate rial coefficients, slice options,etc.,were listed in forms of dialog contro l. When the user inputs these parameters, the application programme can aut omatically check these parameters' validity to ensure that the contents the user inputs are correct, thus, it supplies a kind of security mechanism fo r subsequent automatic control of optical thin film process. The correspond ing algorithm was also given in this paper.