Stability of charge centers in solid Ar

Authors
Savchenko, EV Grigorashchenko, ON Ogurtsov, AN Rudenkov, VV Gumenchuk, GB Lorenz, M Lammers, A Bondybey, VE
Citation
Ev. Savchenko et al., Stability of charge centers in solid Ar, J L TEMP PH, 122(3-4), 2001, pp. 379-387
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LOW TEMPERATURE PHYSICS
ISSN journal
00222291 → ACNP
Volume
122
Issue
3-4
Year of publication
2001
Pages
379 - 387
Database
ISI
SICI code
0022-2291(200102)122:3-4<379:SOCCIS>2.0.ZU;2-U
Abstract
The technique of thermally stimulated exoelectron emission (TSEE) was used for the first time for a study Of thermal stability of charged centers in s olid Ar. The data obtained demonstrate the efficiency of combining the TSEE study with thermally stimulated luminescence (TSL) for trap-level analysis . High thermal stability of charge centers at low temperatures was found.