Estimation of density of localized states of a-Se100-xSbx films using electrical properties

Citation
Mam. Khan et al., Estimation of density of localized states of a-Se100-xSbx films using electrical properties, J PHYS CH S, 62(6), 2001, pp. 1093-1101
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
ISSN journal
00223697 → ACNP
Volume
62
Issue
6
Year of publication
2001
Pages
1093 - 1101
Database
ISI
SICI code
0022-3697(200106)62:6<1093:EODOLS>2.0.ZU;2-M
Abstract
The density of states (DOS) near the Fermi level is calculated using the de conductivity (Mott parameters) and SCLC measurements data. The de conducti vity measurements on thin films of a-Se100-xSbx (x = 0,0.5,2.5, 5 and 10) a re reported in the temperature range (219-375 K). At high temperature (314- 375 K), the conduction occurs in the extended states while at lower tempera ture (219-314 K) the conduction due to variable range-hopping. The I-V meas urements have also been done in a-Se100-xSbx at different electric field. S pace charge limited conduction (SCLC) has also been observed in the present system. (C) 2001 Elsevier Science Ltd. All rights reserved.