Implementation of an analyser crystal method for x-ray diffraction tomography

In this paper we present an experimental method which is well suited to syn chrotron x-ray diffraction tomography. The experimental technique utilizes an analyser crystal placed in the diffracted x-ray beam to selectively dete ct diffracted photons at the desired scattering angle. This arrangement sel ects the prominent diffraction feature of a specimen component, allowing th e spatial distribution of that component to be specifically and quantitativ ely imaged. Images of the spatial variation of the differential x-ray scatt ering cross section (reflectivity) in a cross sectional plane of interest a re reconstructed using an iterative algebraic technique and an error functi onal minimization. Reconstructed images of a well characterized phantom sho w that material features can be clearly delineated. Images based on the spa tial variation of x-ray linear attenuation coefficients and differential co herent scattering cross sections have been reconstructed with approximately 125 mum spatial resolution in the imaging plane.