Semiconductor vertical-cavity surface-emitting lasers (VCSELs) are kno
wn to exhibit a small amount of birefringence. We present a model that
enables us to estimate how much of this is due to the electro-optic e
ffect produced by the inevitable internal electric field in working de
vices; Of vital importance for this model is the notion that the posit
ion-dependent changes in the refractive index should be weighted by th
e local optical intensity both in the spacer as well as in the distrib
uted Bragg reflectors. index variations in the optical nodes thus go u
nnoticed, whereas those in the antinodes can strongly affect the cavit
y resonance. This is related to the idea that the active quantum wells
in a VCSEL should be positioned in optical antinodes to produce the h
ighest; modal gain. The results of our model calculation are compared
with statistical data on the magnitude and orientation of the measured
birefringence in planar proton-implanted VCSELs. These data show the
presence of a systematic contribution to the birefringence, which can
presumably be attributed to the electro-optic effect, and a random con
tribution, which we attribute to stress and strain.