X-ray investigations of III-V compounds: layers, nanostructures, surfaces

Authors
Jenichen, B
Citation
B. Jenichen, X-ray investigations of III-V compounds: layers, nanostructures, surfaces, MAT SCI E B, 80(1-3), 2001, pp. 81-86
Citations number
37
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
80
Issue
1-3
Year of publication
2001
Pages
81 - 86
Database
ISI
SICI code
0921-5107(20010322)80:1-3<81:XIOICL>2.0.ZU;2-C
Abstract
Some recent results of X-ray investigations of epitaxial layer systems are reviewed. The interest is directed to correlation phenomena in the distribu tion of misfit dislocations, to the coexistence of two phases of MnAs in a large range of temperatures, to the stress relaxation in quantum wire struc tures on InP and to the determination of phases of surface reflections. (C) 2001 Elsevier Science B.V. All rights reserved.