The Schottky barrier height in Al/n-In0.35Ga0.65As was engineered using thi
n p-type near-interface In0.35Ga0.65As layers grown by molecular beam epita
xy. The effect of the thickness and doping level of the p-type layer on the
barrier height was also studied by computer simulation. A good agreement w
as obtained between the calculated and experimental barrier height values.
An experimental Schottky barrier height of 0.67 eV with an ideality factor
of 1.15 has been achieved. (C) 2001 Elsevier Science B.V. All rights reserv
ed.