InGaN quantum well (QW) structures with different thicknesses have been cha
racterised by means of cathodoluminescence (CL) in the scanning electron mi
croscope and transmission electron microscopy (TEM), in order to study the
structural defects that limit the device operation, Misfit dislocations app
ear as non-radiative centres in the CL images and compete with the quantum-
well related luminescence. The luminescence red shift with increasing QW th
ickness has been found to be influenced by composition fluctuations. (C) 20
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