Structural analysis of bent KCl and NaCl crystals with ion-induced electron spectroscopy

We have studied ion-induced electron emission from bent KCl and NaCl crysta ls while they are being bombarded by 7 MeV H+. A cylindrical mirror electro n analyzer of wide angular acceptance allowed low beam-dose measurements of the high-energy shadowing effect with negligible influence from radiation damage. In most cases, the shadowing patterns exhibit coexistence of clear and smeared planar images of the crystal planes, indicating the preferentia l distribution of edge dislocations induced in the process of bending cause d by the clevage of the crystals. The present work demonstrates the practic al use of ion-induced electron emission for material characterization under extremely low beam-induced damage, (C) 2001 Elsevier Science B.V. All righ ts reserved.