Using scanning tunneling microscopy we have observed thermally induced disl
ocation glide in monolayer Cu films on Ru(0001) at room temperature. The mo
tion is governed by a Peierls barrier that depends on the detailed structur
e of the dislocations, in particular upon whether the threading dislocation
s that terminate them are dissociated or not. Calculations based on the Fre
nkel-Kontorova model reproduce the threading dislocation structure and prov
ide estimates of the Peierls barrier and dislocation stiffness which are co
nsistent with experiment.