P. Fischer et al., Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy, REV SCI INS, 72(5), 2001, pp. 2322-2324
The combination of magnetic circular dichroism as a magnetic contrast mecha
nism and a transmission x-ray microscope allows imaging of magnetic structu
res with lateral resolutions down to 25 nm. Results on magneto-optical Tb-2
5(Fe75Co25)(75) layers system with thermomagnetically written bits of vario
us sizes were obtained at the x-ray microscope XM-1 at the Advanced Light S
ource in Berkeley, CA. The results prove the thermal stability of the bits
in the recording process. Furthermore the capability of soft x-ray microsco
py with respect to the achievable lateral resolution, element specificity a
nd sensitivity to thin magnetic layers is demonstrated. The potential of im
aging in applied magnetic fields for both out-of-plane and in-plane magneti
zed thin magnetic films is outlined. (C) 2001 American Institute of Physics
.