Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy

Citation
P. Fischer et al., Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy, REV SCI INS, 72(5), 2001, pp. 2322-2324
Citations number
20
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
5
Year of publication
2001
Pages
2322 - 2324
Database
ISI
SICI code
0034-6748(200105)72:5<2322:EIOMDA>2.0.ZU;2-X
Abstract
The combination of magnetic circular dichroism as a magnetic contrast mecha nism and a transmission x-ray microscope allows imaging of magnetic structu res with lateral resolutions down to 25 nm. Results on magneto-optical Tb-2 5(Fe75Co25)(75) layers system with thermomagnetically written bits of vario us sizes were obtained at the x-ray microscope XM-1 at the Advanced Light S ource in Berkeley, CA. The results prove the thermal stability of the bits in the recording process. Furthermore the capability of soft x-ray microsco py with respect to the achievable lateral resolution, element specificity a nd sensitivity to thin magnetic layers is demonstrated. The potential of im aging in applied magnetic fields for both out-of-plane and in-plane magneti zed thin magnetic films is outlined. (C) 2001 American Institute of Physics .