Temperature dependence of output voltage generated by interaction of threshold voltage and mobility of an NMOS transistor

Citation
Im. Filanovsky et al., Temperature dependence of output voltage generated by interaction of threshold voltage and mobility of an NMOS transistor, ANALOG IN C, 27(3), 2001, pp. 229-238
Citations number
18
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
ISSN journal
09251030 → ACNP
Volume
27
Issue
3
Year of publication
2001
Pages
229 - 238
Database
ISI
SICI code
0925-1030(2001)27:3<229:TDOOVG>2.0.ZU;2-O
Abstract
Mutual compensation of mobility and threshold voltage temperature variation s may result in a zero temperature coefficient (ZTC) bias point of an NMOS transistor. The conditions under which this effect occurs, stability of thi s bias point, and the temperature dependence of the output voltage for a di ode-connected transistor operating in the vicinity of ZTC point are investi gated in this paper. Some possible applications of this effect include temp erature sensors with linear dependence of voltage versus temperature, and v oltage and current reference circuits. The theory is verified experimentall y investigating the temperature behavior of an NMOS transistor realized in 0.35 mum CMOS process. The design and simulation results of simple current and voltage reference circuits for implementation in 0.18 mum CMOS technolo gy are given.