Synthesis of thick optical thin-film filters with a layer-peeling inverse-scattering algorithm

Citation
J. Skaar et al., Synthesis of thick optical thin-film filters with a layer-peeling inverse-scattering algorithm, APPL OPTICS, 40(13), 2001, pp. 2183-2189
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
13
Year of publication
2001
Pages
2183 - 2189
Database
ISI
SICI code
0003-6935(20010501)40:13<2183:SOTOTF>2.0.ZU;2-T
Abstract
We present an efficient and accurate method for synthesis of optical thin-f ilm structures. Toe method is based on a differential inverse-scattering al gorithm and considers therefore both phase and amplitude reflectance data. We apply the algorithm to the synthesis of filters with arbitrary index lay ers and two-material filters consisting of only high- and low-index layers. The layered structure is approximated by a stack of discrete reflectors wi th equal distance between all reflectors. This mirror stack is in turn dete rmined from the desired, complex reflection spectrum by a layer-peeling inv erse-scattering algorithm. The complexity of the design algorithm is approx imately the same as that of the forward problem of computing the spectrum f rom a known structure. (C) 2001 Optical Society of America.