E. Compain et B. Drevillon, COMPLETE HIGH-FREQUENCY MEASUREMENT OF MUELLER MATRICES BASED ON A NEW COUPLED-PHASE MODULATOR, Review of scientific instruments, 68(7), 1997, pp. 2671-2680
A new polarization modulator is presented. It uses two phase-locked id
entical electro-optic phase modulators at 50 kHz. Thanks to a coupling
object introduced between the two phase modulators, the four Stokes p
arameters of the light beam are independently modulated on the basis o
f the first and second complex harmonics of the modulation signal. A M
ueller matrix ellipsometer (MME) using this new modulation and a multi
channel polarimeter are also described. The data processing and the fe
edback control of Pockels cells is based on a numerical Fourier transf
orm system. It allows one to measure simultaneously, in one modulation
period (20 mu-s), the 16 coefficients of any Mueller matrix. This MME
takes advantage of an easy-to-operate calibration method. The high-fr
equency modulation of the four parameters of the polarization enables
low-light-level measurements (without any chopper and lock-in) and pre
sents spectroscopic capabilities. It provides a promising tool for the
study of many subjects of growing interest like, for example, rough s
urfaces treatment or particle characterization. (C) 1997 American Inst
itute of Physics.