W. Jiang et al., EFFECT OF PROTON IMPLANTATION ON THE DEGRADATION OF GAAS ALGAAS VERTICAL-CAVITY SURFACE-EMITTING LASERS/, Electronics Letters, 33(2), 1997, pp. 137-139
The electroluminescence (EL) technique is used to analyse the degradat
ion mode of VCSELs with proton implantation for current confinement. P
oint defects generated by the implantation in the active layer are bel
ieved to affect the VCSEL long term reliability.