Virtual test reduces semiconductor product development time

Citation
T. Hogan et D. Heffernan, Virtual test reduces semiconductor product development time, ELECT COMM, 13(2), 2001, pp. 77-83
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS & COMMUNICATION ENGINEERING JOURNAL
ISSN journal
09540695 → ACNP
Volume
13
Issue
2
Year of publication
2001
Pages
77 - 83
Database
ISI
SICI code
0954-0695(200104)13:2<77:VTRSPD>2.0.ZU;2-F
Abstract
In the semiconductor industry's evolutionary life cycle, the speed at which products are introduced to the market-place is key to the competitive succ ess of individual companies. The semiconductor industry is classed as a fas t-changing industry in which product technology, manufacturing process tech nology and industry organisation need to be continuously updated in relativ ely short cycle times. This paper looks at the test engineering aspect of t he IC (integrated circuit) product development process and describes how an emerging 'virtual test' methodology can be effectively applied to reduce t he overall product development time for semiconductor devices.