In the semiconductor industry's evolutionary life cycle, the speed at which
products are introduced to the market-place is key to the competitive succ
ess of individual companies. The semiconductor industry is classed as a fas
t-changing industry in which product technology, manufacturing process tech
nology and industry organisation need to be continuously updated in relativ
ely short cycle times. This paper looks at the test engineering aspect of t
he IC (integrated circuit) product development process and describes how an
emerging 'virtual test' methodology can be effectively applied to reduce t
he overall product development time for semiconductor devices.