A new varactor model based on the BSIM3v3 model (Berksley short-channel IGF
ET model) is presented for the first time to model the behaviour of a silic
on-based metal-insulator-semiconductor (MIS) varactor under different bias
conditions and operating Frequencies. The root mean square (RMS) errors of
the s-parameters between the measured and simulated data are less than 2%.
The presented varactor model provides satisfactory performance prediction,
which is necessary and critical for realising silicon radio frequency integ
rated circuits (RFICs).