Polyethylene terephthalate (PET) and polycarbonate (PC) films were irradiat
ed by S, Kr and Xe ions and were illuminated with ultraviolet light. The no
rmalized track etch rate for PET and PC films etched in different condition
was measured by conductometric experiments. It is shown that normalized tr
ack etch rate can be over 1000 for PET films, 2000 for PC films under optim
ized condition. TEM photographs of copper nanowires electroplated into nano
porous nuclear track membranes show that the narrowest wire diameter of cop
per nanowires is 20nm and that the pore diameter calculated by conductometr
ic experiments is in agreement with the wire diameter measured by TEM when
the pore diameter is over 30nm.