Using electrical bitmap results from embedded memory to enhance yield

Authors
Segal, J Jee, A Lepejian, D Chu, B
Citation
J. Segal et al., Using electrical bitmap results from embedded memory to enhance yield, IEEE DES T, 18(3), 2001, pp. 28-39
Citations number
13
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
18
Issue
3
Year of publication
2001
Pages
28 - 39
Database
ISI
SICI code
0740-7475(200105/06)18:3<28:UEBRFE>2.0.ZU;2-Q
Abstract
Analyzing bitmap results can provide insight into physical failure mechanis ms normally acquired only through the complex, time-consuming, and expensiv e process of failure analysis.