A novel high performance stacked LDD RF LDMOSFET

Citation
J. Cai et al., A novel high performance stacked LDD RF LDMOSFET, IEEE ELEC D, 22(5), 2001, pp. 236-238
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
22
Issue
5
Year of publication
2001
Pages
236 - 238
Database
ISI
SICI code
0741-3106(200105)22:5<236:ANHPSL>2.0.ZU;2-5
Abstract
A novel silicon RF lateral double-diffused metal oxide semiconductor field effect transistor (LDMOSFET) structure, using a simple vet effective concep t of stacked lightly doped drain (LDD), is proposed. The stacked lavers of LDD minimizes the on-state resistance of the transistor due to the nt dopin g used in the top LDD layer, and also raises the device breakdown voltage d ue to the charge compensation in the composite LDD region. Therefore, for t he same blocking voltage rating, the stacked LDD structure allows the LDMOS FET to have a higher current handling capability, This in turn causes the t ransconductance Gm to be higher, leading to higher RF performance for the p ower device. Measured results show that a 67% improvement in I-dsat and a 1 6% improvement in forward blocking voltage are obtained. Furthermore, the n ew device achieves an increase in transconductance of 145% and improves cut -off frequency by 108% at a gate voltage of 10 V.