A novel fast approach for estimating error propagation in decision feedback detectors

Citation
M. Jin et al., A novel fast approach for estimating error propagation in decision feedback detectors, IEEE J SEL, 19(4), 2001, pp. 668-676
Citations number
18
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS
ISSN journal
07338716 → ACNP
Volume
19
Issue
4
Year of publication
2001
Pages
668 - 676
Database
ISI
SICI code
0733-8716(200104)19:4<668:ANFAFE>2.0.ZU;2-5
Abstract
The study of error-burst statistics is important for all detection systems, and more so for the decision feedback class. In data storage application, many detection systems use decision feedback in one form or another, Fixed- delay tree search with decision feedback (FDTS/DF) and decision feedback eq ualization (DFE) are the direct forms, whereas the recently developed parti al response detectors such as the reduced state sequence estimator (RSSE) a nd noise predictive maximum likelihood (NPML) detectors are the other forms . Although DF reduces the system complexity, it is inevitably linked with e rror propagation (EP), which can be quantified using error-burst statistics . Analytical evaluation of these statistics is difficult, if not impossible , because of the complexity of the problem, Hence, the usual practice is to use computer simulations. However, the computational time in traditional b it-by-bit simulations can be prohibitive at meaningful signal-to-noise rati os. In this paper, we propose a novel approach for fast estimation of error -burst statistics in FDTS/DF detectors, which is also applicable to other d etection systems. In this approach, error events are initiated more frequen tly than natural by artificially injecting noise samples. These noise sampl es are generated using a transformation that results in significant reducti on in computational complexity. Simulation studies show that the EP perform ance obtained by the proposed method matches closely with those obtained by bit-by-bit simulations, while saving as much as 99% of simulation time.