This paper addresses the lifetime characteristics of standard and synthetic
spin valves of different PtMn antiferromagnet (AFM) thicknesses and compos
itions. It shows that loss of magnetoresistance with time at elevated tempe
rature is less pronounced for synthetic structures, for thinner PtMn AFM fi
lms exchange-annealed for relatively longer times, and Pt-rich compositions
of PtMn, The lifetime temperature T-max is defined as the maximum operatin
g temperature for the spin valve that results in less than a 10% drop in ou
tput for a five-year 50% duty cycle. The generalized prediction of lifetime
temperature T-max from the more usable unblocked ratio (UBR) point on the
UBR-versus-temperature curve is complicated by test conditions and initial
H(e)x values. For H(e)x values and reverse field magnitudes for the sheet f
ilm spin valve samples tested here, the tolerable UBR was in the 6-8% range
, and Tmax values in the 170 degrees -205 degreesC range. Choosing the corr
ect reverse field for DeltaT(b) measurements was important for synthetic st
ructures because of the interaction between the applied field and the coupl
ing field between the inner and outer pinned layers in the synthetic struct
ure. Finished heads show T-max values that are lower by 40 degrees -55 degr
ees for the five-year 50% duty cycle criterion compared to sheet films. Thi
s highlights the importance of processing environments, especially in slide
r fabrication, and imposes a further restriction on the acceptable sheet fi
lm tolerable UBR, reducing it to 3-4%, Activation energies from lifetime te
sts are in the range 2.2 to 2.6 eV for all samples including finished slide
rs, which indicates that differences in lifetimes are not associated with l
arge variability in the activation energy of depinning within the PtMn syst
em. The time-dependence of magnetic properties such as interlayer coupling
(H-ilc) and coercivity (H-c) of the free layer is very important and exhibi
ts runaway behavior with time. It must be monitored for deleterious effects
.