Investigation of the proportional difference characteristics of MOSFETs

Citation
Mz. Xu et al., Investigation of the proportional difference characteristics of MOSFETs, INT J ELECT, 88(4), 2001, pp. 383-393
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF ELECTRONICS
ISSN journal
00207217 → ACNP
Volume
88
Issue
4
Year of publication
2001
Pages
383 - 393
Database
ISI
SICI code
0020-7217(200104)88:4<383:IOTPDC>2.0.ZU;2-0
Abstract
A proportional difference operator method has been presented to study the e lectrical characteristics of MOSFETs in all the operating regimes. It is sh own that the proportional difference drain current versus the drain voltage exhibits a spectrum feature in all regions of operation including the subt hreshold regime and the saturation regime. The amplitude of the spectrum pe ak is related to the effective carrier mobility, and the spectrum peak posi tion responds to the voltage constants in each operating region (including the subthreshold and saturation regime) of a MOSFET. This then enables the more important statistic performance of MOSFETs to be evaluated using the p roportional difference operator method. Analytical expressions for computin g these parameters (such as effective carrier mobility, thermal voltage, th reshold voltage etc.) have been derived and experimental results have been presented.