K. Tada et al., Influence of one monolay er thickness variation in GaAs/AlGaAs five-layer asymmetric coupled quantum well upon electrorefractive index change, JPN J A P 1, 40(2A), 2001, pp. 656-661
The five-layer asymmetric coupled quantum well (FACQW) is a new potential-t
ailored quantum well (QW) for ultrafast and low-voltage optical modulators
and switches. First, the influence of one monolayer (ML) thickness variatio
n of a single layer in the GaAs/AlGaAs FACQW on the electrorefractive index
change Deltan is theoretically studied. The thickness variation of two thi
cker GaAs lavers has a considerable influence on Deltan of the FACQW. while
the thickness variation of thin AlAs and AlGaAs barrier layers has a small
er influence on Deltan. The ratio of the thicknesses of the two GaAs well l
ayers significantly affects the Deltan characteristics of the FACQW. The ch
ange Deltan does not vary appreciably as long as the ratio is kept constant
. Second, the influence of the statistical fluctuation of the layer thickne
ss by 1 ML in all of the layers on the Deltan characteristics of the FACQW
is also discussed. Even when Deltan decreases with the increase of the occu
rrence probability of a layer being thicker or thinner by 1 ML, the FACQW s
till has a much larger Deltan than conventional rectangular quantum wells d
o.