Electric field vector mapping in sphere-to-plane electrode system using simultaneous three-direction optical measurement system

Citation
H. Ihori et al., Electric field vector mapping in sphere-to-plane electrode system using simultaneous three-direction optical measurement system, JPN J A P 1, 40(2A), 2001, pp. 914-915
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
2A
Year of publication
2001
Pages
914 - 915
Database
ISI
SICI code
Abstract
We have investigated nonuniform electric field vector distributions in liqu id dielectrics. We have already reported on measurements of symmetrical and nonsymmetrical electric field vector distribution using the Kerr electroop tic effect and our unique reconstruction method based on the computed tomog raphy technique. For the measurement of a field vector distribution, it was necessary to measure light intensity twice by changing the optical axis of optical wedges. Moreover, the intensity measurement had to be carried out at many points around the electrode system, and therefore it took considera ble time to measure an electric field distribution. Thus, we developed a si multaneous three-direction optical measurement system with three optical sy stems combined with a two-beam method. Using the new measurement system, th e electric field vector distribution was measured in about 0.1 min.