H. Zama et al., Tantalum aluminum alkoxide as a double-metal precursor for metalorganic chemical vapor deposition of Sr2AlTaO6, JPN J A P 2, 40(2B), 2001, pp. L167-L169
We proposed resolving the poor controllability in the metalorganic chemical
vapor deposition (MOCVD) of a complex oxide film consisting of a few metal
elements, Sr2AlTaO6 (SAT) film, by using a double-metal source, tantalum a
luminum isopropoxide TaAl(O-iC(3)H(7))(8). It had a melting point as low as
93 degreesC and generated suitable vapor pressure for MOCVD at a temperatu
re of 100 degreesC. The supply metal ratio, Al/Ta. was similar to 1. becaus
e it remained a double-metal structure in the vapor phase. We grew stoichio
metric SAT films using it as a metal source.