Photocurrent mapping with submicron resolution on the silicon-electrolyte junction by using near-field optics (vol 89, pg 3328, 2001)

Citation
H. Diesinger et al., Photocurrent mapping with submicron resolution on the silicon-electrolyte junction by using near-field optics (vol 89, pg 3328, 2001), J APPL PHYS, 89(10), 2001, pp. 5801-5801
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
10
Year of publication
2001
Pages
5801 - 5801
Database
ISI
SICI code
0021-8979(20010515)89:10<5801:PMWSRO>2.0.ZU;2-2