Original surface morphology of epitaxial NiO layers grown on MgO(110)

Citation
B. Warot et al., Original surface morphology of epitaxial NiO layers grown on MgO(110), J CRYST GR, 224(3-4), 2001, pp. 309-315
Citations number
17
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
224
Issue
3-4
Year of publication
2001
Pages
309 - 315
Database
ISI
SICI code
0022-0248(200104)224:3-4<309:OSMOEN>2.0.ZU;2-Y
Abstract
NiO layers of different thickness have been epitaxially grown on a MgO(1 1 0) substrate at various temperatures in the range 700-900 degreesC. Investi gations by reflection high energy electron diffraction, atomic force micros copy (AFM) and high resolution transmission electron microscopy (HRTEM) giv e evidence for a roof-like morphology of the NiO(l 1 0) surface consisting in (1 0 0) and (0 1 0) facets elongated along the [0 0 1] direction. The pe riod and height of these facets depend on the layer thickness and the depos ition temperature. This particular surface configuration is due to a minimi zation of the surface energy during the growth process. (C) 2001 Elsevier S cience B.V. All rights reserved.